This page lists the changes made to StepVu -- enhancements and bug fixes.
Version 1.03 4-16-2013Scaling Bug in Offset Fixed
Fixed a bug when reading the offset values for SINF files. The correct offset is now performed.
Version 1.02c 4-13-2013fixed margin scaling
Margin was incorrectly scaled. Fixed.Reduced text size to avoid cell extents error.
(This is really a qkcvu3 problem but by reducing the text magnitude, Qckvu3 does not get confused about the cell extents.)Die Count
Added a count of each die type to the log file
Version 1.02a 4-03-2013Image Offset Error for ASML 5500
Fixed an error when computing the image offset and size.
Version 1.02 3-29-2013Image Support
Added image support with layering in addition to cell outline.Wafer Margin
Added ability to draw a user defined margin to show the exclusion zone.
Version 1.01 3-15-2013SINF Fix
Previous version would fail if the SINF input file did not have a value for wafer flat. If this occurs now, the program assumes that the wafer flat=0 and that it is on the bottom of the wafer.
Version 1.00a 1-28-2013SINF Support Added
Added support for the SINF file format (used in wafer test)
Version 1.00 1-20-2013Initial Release of StepVU as a PlugIn
This is the initial release of the Qckvu3/W plug-in version of StepVu and replaces the previous StepVu originally developed in 2003.
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