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GDS-SR Revision History1.11 [07/06/2010]Output GDSII Resolution SettingA rounding error caused improper setting of the GDSII output file resolution. This has been fixed. 1.10 [06/09/2010]Data Type Support AddedPrevious versions of GDS_SR ignored the GDSII datatype parameter. This has been fixed - data is passed to the output with full datatype discrimination. 1.09 [06/08/2010]Added PATH SupportPrevious versions of GDS_SR dropped PATH data entities. This has been fixed. 1.08 [06/04/2010]Wafer FlatsAdded support for flats on all four sides of the wafer. Output Directory for GDSIIFixed a bug where exporting a GDSII file without a collar left the output file in the temp directory. Coordinate ReadoutAdded a co-ordinate readout to the status bar as the mouse is moved. Output Data Grid based on Input Data GridPrevious versions hardwired the output GDSII grid to UM/1000. This revision detects the input data units/grid from the first die file imported and uses that as the output grid. Note that all targets and other imported files must have matching units and data grid. Version 1.07 7/27/2007Maximum number of die insertion increased.Increased the maximum allowed number of die in each drection from 100 to 1000. That gives you a maximum number of 1,000,000 dies. Version 1.06 11/18/05Added units and precision data to the Import Die dialog.This was done so that the user can be sure that all files imported have the same GDSII units and precision. Added support for selecting a single structure from a collar target file.Collar Cutout Data Entry Fixed the collar command line in cases where the cutout parameters were not entered in the correct order. i.e. LLx, LLy, URx, URy Wafer Disk OutputAdded the ability to selectively export the wafer and margin along with the GDSII data. Users may want to see the wafer disk in the GDSII output during debugging but generally not for producing the final mask output. Collar Generation BugFixed a bug associated with synchronization of files created by the collar program. Job File InfoThe contents of the job file have been updated to support recording/reading of all of the new GDS-SR functions (including target placement, cutouts and collar parameters ...) Version 1.05 [11/08/2005]GUI UpdateRe-organized the menus to better reflect the flow of the product. Improved Preference SettingsAdded a Settings dialog to the File menu which allows the user to define directories for input, output and temporary files. Staggered ArrayAdded support for staggered array patterns. Collar GenerationImproved the Collar Cutouts dialog, so that it used a spreadsheet style interface. Added support to define cutouts by center, width and height. Target PlacementAdded support for defining collar targets and mask labels. Version 1.04 [09/28/2005]Stepping ParametersAdded support for variable street size in x and y, as well as negative street size. This allows die to be over-lapped. Collar GeneratorAdded collar generation function - a tool that finds the extents of the array and generates metal from the array edge out to the edge of the mask; includes user defined cutouts for placing targets and mask labels. GDSII Output ControlAdded Export Settings to control better which layers the wafer data is output on. Version 1.03 [09/09/2005]Array Multiple Die/RatiosModified GDS-SR to work better with multiple die in different ratios. Version 1.02 [04/21/2005]Import Mask FileAdded the ability to import GDSII mask files. These files will be flattened and then the file <file_name>_flat.gds will have its boundaries imported into the viewer. GDSII Export AddedAdded the ability to export a GDSII file. The wafer data will be output as GDS ASCII and converted to GDSII. This GDSII file, <file_name>_wafer.gds, will be combined with all of the flattened mask files. Multiple Die in ArrayAdded support for multiple die.The Import Die dialog now provides the option to over-ride a die definition or add a new die definition. In the case where the structures have the same name, the die must be over-ridden. Delete Arrayed DieAdded the ability to delete selected die from the array. Re-generating the array rests any deleted die. Replace Arrayed DieAdded the ability to change a die to another type. This allows modifying select die inside of the array to be targets or test devices. Color and Pattern for DisplayAdded color and pattern options to the main display for the imported die array. Display by ComponentAdded the ability to selectively view each component - wafer, margin, die array and collar. SREF offsetDisabled the SREF offset setting when using street center as it does not apply. InfoAdded an Info command which displays data about a die - the name, which file it came from, if any, and the insertion point. Version 1.01 02/28/05Initial ReleaseThis is the initial release of GDS-SR.
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